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An applicable test data generation algorithm for domain errors

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Published:01 March 1998Publication History

ABSTRACT

An integrated testing criterion is proposed that extends traditional criteria to be effective to reveal domain errors. The method requires many fewer test cases and is applicable for any kind of predicates. An automated test data generation algorithm is developed to satisfy the criterion. This is the first integrated algorithm that unites path selection and test data generation. The method is based on function minimization and is extended to find required test cases corresponding to ON-OFF points very quickly. In this way the algorithm is dynamic and thus can be used in practice.

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          cover image ACM Conferences
          ISSTA '98: Proceedings of the 1998 ACM SIGSOFT international symposium on Software testing and analysis
          March 1998
          170 pages
          ISBN:0897919718
          DOI:10.1145/271771

          Copyright © 1998 ACM

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          • Published: 1 March 1998

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          ISSTA '98 Paper Acceptance Rate16of47submissions,34%Overall Acceptance Rate58of213submissions,27%

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