skip to main content
10.1145/277044.277208acmconferencesArticle/Chapter ViewAbstractPublication PagesdacConference Proceedingsconference-collections
Article
Free Access

Functional verification of a multiple-issue, out-of-order, superscalar Alpha processor—the DEC Alpha 21264 microprocessor

Published:01 May 1998Publication History

ABSTRACT

DIGITAL's Alpha 21264 processor is a highly out-of-order, superpipelined, superscalar implementation of the Alpha architecture, capable of a peak execution rate of six instructions per cycle and a sustainable rate of four per cycle. The 21264 also features a 500 MHz clock speed and a high-bandwidth system interface that channels up to 5.3 Gbytes/second of cache data and 2.6 Gbytes/second of main-memory data into the processor. Simulation-based functional verification was performed on the logic design using implementation-directed, pseudo-random exercisers, supplemented with implementation-specific, hand-generated tests. Extensive functional coverage analysis was performed to grade and direct the verification effort. The success of the verification effort was underscored by first prototype chips which were used to boot multiple operating systems across several different prototype systems.

References

  1. 1.Linley Gwennap, "Digital 21264 Sets New Standard," Microprocessor Report (October 28, 1996): 11-16.Google ScholarGoogle Scholar
  2. 2.Mike Kantrowitz and Lisa Noack, "Functional Verification of a Multiple-issue, Pipelined, Superscalar Alpha Processor ~ -- the Alpha 21164 CPU Chip," Digital Technical Journal, vol. 7, no. 1 (1995): 136-143. Google ScholarGoogle ScholarDigital LibraryDigital Library
  3. 3.W. Anderson, "Logical Verification of the NVAX CPU Chip Design," Digital Technical Journal, vol. 4, no. 3 (Summer 1992): 38-46.Google ScholarGoogle Scholar
  4. 4.A. Aharon, A. Bar-David, B. Dorfman, E. Gofman, M. Leibowitz, and V. Schwartzburd, "Verification of the IBM RISC System/6000 by a Dynamic Biased Pseudo-random Test Program Generator,"lBM Systems Journal, vol. 30, no. 4 (1991): 527-538. Google ScholarGoogle ScholarDigital LibraryDigital Library
  5. 5.A. Ahi, G. Burroughs, A. Gore, SLaMar, C-Y. Lin, and A. Wiemann, "Design Verification of the HP 9000 Series 700 PA-RISC Workstations," ttewlett-Packard Journal (August 1992): 34-42.Google ScholarGoogle Scholar
  6. 6.D. Wood, G. Gibson, and R. Katz, "Verifying a Multiprocessor Cache Controller Using Random Test Generation," IEEE Design and Test of Computers(August 1990): 13-25. Google ScholarGoogle ScholarDigital LibraryDigital Library

Index Terms

  1. Functional verification of a multiple-issue, out-of-order, superscalar Alpha processor—the DEC Alpha 21264 microprocessor

            Recommendations

            Comments

            Login options

            Check if you have access through your login credentials or your institution to get full access on this article.

            Sign in
            • Published in

              cover image ACM Conferences
              DAC '98: Proceedings of the 35th annual Design Automation Conference
              May 1998
              820 pages
              ISBN:0897919645
              DOI:10.1145/277044

              Copyright © 1998 ACM

              Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

              Publisher

              Association for Computing Machinery

              New York, NY, United States

              Publication History

              • Published: 1 May 1998

              Permissions

              Request permissions about this article.

              Request Permissions

              Check for updates

              Qualifiers

              • Article

              Acceptance Rates

              Overall Acceptance Rate1,770of5,499submissions,32%

              Upcoming Conference

              DAC '24
              61st ACM/IEEE Design Automation Conference
              June 23 - 27, 2024
              San Francisco , CA , USA

            PDF Format

            View or Download as a PDF file.

            PDF

            eReader

            View online with eReader.

            eReader