E-ECC: Low Power Erasure and Error Correction Schemes for Increasing Reliability of Commodity DRAM Systems

ABSTRACT

Most server-grade memory systems provide Chipkill-Correct error protection at the expense of power and/or performance overhead. In this paper we present low overhead schemes for improving the reliability of commodity DRAM systems with better power and IPC performance compared to Chipkill-Correct solutions. Specifically, we propose two erasure and error correction (E-ECC) schemes for x8 memory systems that have 12.5% storage overhead and do not require any change in the existing memory architecture. Both schemes have superior error performance due to the use of a strong ECC code, namely, RS(36,32) over GF(28). Scheme 1 activates 18 chips per access and has stronger reliability compared to Chipkill-Correct solutions. If the location of the faulty chip is known, Scheme 1 can correct an additional random error in a second chip. Scheme 2 trades off reliability for higher energy efficiency by activating only 9 chips per access. It cannot correct random errors due to a chip failure but can detect them with 99.9986% probability, and once a chip is marked faulty due to persistent errors, it can correct all errors due to that chip. Synthesis results in 28nm node show that the RS (36,32) code results in a very low decoding latency that can be well-hidden in commodity memory systems and, therefore, it has minimal effect on the DRAM access latency. Evaluations based on SPEC CPU 2006 sequential and multi-programmed workloads show that compared to Chipkill-Correct, the proposed Schemes 1 and 2 improve IPC by an average of 3.2% (maximum of 13.8%) and 4.8% (maximum of 31.8%) and reduce the power consumption by an average of 16.2% (maximum of 25%) and 26.8% (maximum of 36%), respectively.

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Index Terms

• Computer systems organization

  • Dependable and fault-tolerant systems and networks

• General and reference

  • Cross-computing tools and techniques

    • Performance

• Hardware

  • Hardware test

  • Integrated circuits

    • Semiconductor memory

      • Dynamic memory

  • Robustness

• Networks

  • Network performance evaluation

• Software and its engineering

  • Software creation and management

    • Software development techniques

      • Error handling and recovery