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A method to diagnose faults in linear analog circuits using an adaptive tester

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Published:01 January 1999Publication History
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References

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          cover image ACM Conferences
          DATE '99: Proceedings of the conference on Design, automation and test in Europe
          January 1999
          730 pages
          ISBN:1581131216
          DOI:10.1145/307418

          Copyright © 1999 ACM

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          • Published: 1 January 1999

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