Coefficient-based parametric faults detection in analog circuits

ABSTRACT

Coefficient-based method is introduced for the parametric faults detection in analog circuits. By use of pseudo Monte-Carlo simulation we can greatly speed up the calculation of bounds of CUT transfer function's coefficients. We can estimate transfer function's actual numeric coefficients with system identification method. There is no need for a apriori knowledge of the symbolic transfer function. Finally we show that it is possible to determine whether any given CUT is faulty.

REFERENCES

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INDEX TERMS

Primary Classification:
  B. Hardware
  B.7 INTEGRATED CIRCUITS
      B.7.3 Reliability and Testing**

General Terms:
Measurement

Keywords:
Monte-Carlo simulation, fault detection, parametric faults, system identification