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ABSTRACT
The relentless move toward single chip integration of RF, analog and digital blocks results in significant noise coupling effects that can degrade performance and hence, should be controlled. In this paper, we propose a practical methodology that uses a suite of commercial tools in combination with a high-speed extractor based on an innovative semi-analytical method to deal with noise coupling problems, and enable RF designers to achieve a first silicon-success of their chips. The integration of the methodology in a typical RF design flow is illustrated and its successful application to achieve a single-chip integration of a transceiver demonstrated.
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Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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