skip to main content
article

A circuit level fault model for resistive bridges

Published:01 October 2003Publication History
Skip Abstract Section

Abstract

Delay faults are an increasingly important test challenge. Modeling bridge faults as delay faults helps delay tests to detect more bridge faults. Traditional bridge fault models are incomplete because these models only model the logic faults or these models are not efficient to use in delay tests for large circuits. In this article, we propose a physically realistic yet economical resistive bridge fault model to model delay faults as well as logic faults. An accurate yet simple delay calculation method is proposed. We also enumerate all possible fault behaviors and present the relationship between input patterns and output behaviors, which is useful in ATPG. Our fault simulation results show the benefit of at-speed tests.

References

  1. Chakravarty, S. 1997. On the capability of delay tests to detect bridges and opens. In Proceedings of the Asian Test Symposium. 314--319. Google ScholarGoogle ScholarDigital LibraryDigital Library
  2. Chuang, W. and Hajj, I. N. 1993. Fast mixed-mode simulation for accurate MOS bridging fault detection. In Proceedings of the International Symposium on Circuits and Systems. 1503--1506.Google ScholarGoogle Scholar
  3. Hao, H. and McCluskey, E. J. 1991. "Resistive shorts" within CMOS gates. In Proceedings of the International Test Conference. 292--301. Google ScholarGoogle ScholarDigital LibraryDigital Library
  4. Irajpour, S., Nazarian, S., Wang, L., Gupta, S. K., and Breuer, M. A. 2003. Analyzing crosstalk in the presence of weak bridge defects. In Proceedings of the VLSI Test Symposium. 385--393. Google ScholarGoogle ScholarDigital LibraryDigital Library
  5. Kashyap, C. V., Alpert, C. J., and Devgan, A. 2000. An "Effective" capacitance based delay metric for RC interconnect. In Proceedings of the International Conference on Computer-Aided Design. 229--235. Google ScholarGoogle ScholarDigital LibraryDigital Library
  6. Krstic, A., Jiang, Y. M., and Cheng, K. T. 1999. Delay testing considering power supply noise effects. In Proceedings of the International Test Conference. 181--190. Google ScholarGoogle ScholarDigital LibraryDigital Library
  7. Moore, W., Gronthoud, G., Baker, K., and Lousberg, M. 2000. Delay-fault testing and defects in sub-micron ICs---does critical resistance really mean anything? In Proceedings of the International Test Conference. 95--104. Google ScholarGoogle ScholarDigital LibraryDigital Library
  8. O'Brien, P. R. and Savarino, T. L. 1989. Modeling the driving-point characteristic of resistive interconnect for accurate delay estimation. In Proceedings of the International Conference on Computer-Aided Design. 512--515.Google ScholarGoogle Scholar
  9. Pillage, L. and Rohrer, R. 1990. Asymptotic waveform evaluation for timing analysis. IEEE Trans. Computer-Aided Des. Integ. Circ. Syst. 9, 4(Apr.). 352--366.Google ScholarGoogle ScholarCross RefCross Ref
  10. Qiu, W., Lu, X., Li, Z., Walker, D. M. H., and Shi, W. 2003. CodSim: A combined delay fault simulator. In Proceedings of the International Symposium on Defect and Fault Tolerance in VLSI Systems. To appear. Google ScholarGoogle ScholarDigital LibraryDigital Library
  11. Renovell, M., Huc, P., and Bertrand, Y. 1994. CMOS bridging fault modeling. In Proceedings of the VLSI Test Symposium. 393--397.Google ScholarGoogle Scholar
  12. Renovell, M., Huc, P., and Bertrand, Y. 1995. The concept of resistance interval: A new parametric model for realistic resistive bridging fault. In Proceedings of the VLSI Test Symposium. 184--189. Google ScholarGoogle ScholarDigital LibraryDigital Library
  13. Rodriguez-Montanes, R., Bruls, E. M. J. G., and Figueras, J. 1992. Bridging defect resistance measurements in a CMOS process. In Proceedings of the International Test Conference. 892--899. Google ScholarGoogle ScholarDigital LibraryDigital Library
  14. Sar-Dessai, V. R. and Walker, D. M. H. 1999. Resistive bridge fault modelling, simulation and test generation. In Proceedings of the International Test Conference. 596--605. Google ScholarGoogle ScholarDigital LibraryDigital Library
  15. Shaw, D., Al-Khalili, D., and Rozon, C. 2001. Accurate CMOS bridge fault modeling with neural network-based VHDL saboteurs. In Proceedings of the International Conference on Computer-Aided Design. 531--536. Google ScholarGoogle ScholarDigital LibraryDigital Library
  16. Spica, M., Tripp, M., and Roeder, R. 2001. A new understanding of bridge defect resistances and process interactions from correlating inductive fault analysis predictions to empirical test results. In Proceedings of the International Workshop on Defect Based Testing. 11--16.Google ScholarGoogle Scholar
  17. Weste, N. H. E. and Eshraghian, K. 1993. Principles of CMOS VLSI Design---A Systems Perspective. Chapter 2. Google ScholarGoogle ScholarDigital LibraryDigital Library

Index Terms

  1. A circuit level fault model for resistive bridges

        Recommendations

        Comments

        Login options

        Check if you have access through your login credentials or your institution to get full access on this article.

        Sign in

        Full Access

        • Published in

          cover image ACM Transactions on Design Automation of Electronic Systems
          ACM Transactions on Design Automation of Electronic Systems  Volume 8, Issue 4
          October 2003
          194 pages
          ISSN:1084-4309
          EISSN:1557-7309
          DOI:10.1145/944027
          Issue’s Table of Contents

          Copyright © 2003 ACM

          Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

          Publisher

          Association for Computing Machinery

          New York, NY, United States

          Publication History

          • Published: 1 October 2003
          Published in todaes Volume 8, Issue 4

          Permissions

          Request permissions about this article.

          Request Permissions

          Check for updates

          Qualifiers

          • article

        PDF Format

        View or Download as a PDF file.

        PDF

        eReader

        View online with eReader.

        eReader