skip to main content
10.1145/3180155.3182552acmconferencesArticle/Chapter ViewAbstractPublication PagesicseConference Proceedingsconference-collections
abstract

MSeer: an advanced technique for locating multiple bugs in parallel

Published:27 May 2018Publication History

ABSTRACT

In practice, a program may contain multiple bugs. The simultaneous presence of these bugs may deteriorate the effectiveness of existing fault-localization techniques to locate program bugs. While it is acceptable to use all failed and successful tests to identify suspicious code for programs with exactly one bug, it is not appropriate to use the same approach for programs with multiple bugs because the due-to relationship between failed tests and underlying bugs cannot be easily identified. One solution is to generate fault-focused clusters by grouping failed tests caused by the same bug into the same clusters. We propose MSeer - an advanced fault localization technique for locating multiple bugs in parallel. Our major contributions include the use of (1) a revised Kendall tau distance to measure the distance between two failed tests, (2) an innovative approach to simultaneously estimate the number of clusters and assign initial medoids to these clusters, and (3) an improved K-medoids clustering algorithm to better identify the due-to relationship between failed tests and their corresponding bugs. Case studies on 840 multiple-bug versions of seven programs suggest that MSeer performs better in terms of effectiveness and efficiency than two other techniques for locating multiple bugs in parallel.

References

  1. R. Gao and W. E. Wong, "MSeer - An Advanced Technique for Locating Multiple Bugs in Parallel," Transactions on Software Engineer, accepted on November 2017Google ScholarGoogle ScholarDigital LibraryDigital Library
  2. W. E. Wong, X. Li, P. A. Laplante, "Be More Familiar with Our Enemies and Pave the Way Forward: A Review of the Roles Bugs Played in Software Failures," Journal of Systems and Software, vol. 133, pp. 68--94, November 2017Google ScholarGoogle ScholarCross RefCross Ref
  3. W. E. Wong, R. Gao, Y. Li, R. Abreu and F. Wotawa, "A Survey on Software Fault Localization," IEEE Transactions on Software Engineering, vol. 42, issue. 8, pp. 707--740, August 2016 Google ScholarGoogle ScholarDigital LibraryDigital Library

Index Terms

  1. MSeer: an advanced technique for locating multiple bugs in parallel
        Index terms have been assigned to the content through auto-classification.

        Recommendations

        Comments

        Login options

        Check if you have access through your login credentials or your institution to get full access on this article.

        Sign in
        • Published in

          cover image ACM Conferences
          ICSE '18: Proceedings of the 40th International Conference on Software Engineering
          May 2018
          1307 pages
          ISBN:9781450356381
          DOI:10.1145/3180155
          • Conference Chair:
          • Michel Chaudron,
          • General Chair:
          • Ivica Crnkovic,
          • Program Chairs:
          • Marsha Chechik,
          • Mark Harman

          Copyright © 2018 Owner/Author

          Permission to make digital or hard copies of part or all of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for third-party components of this work must be honored. For all other uses, contact the Owner/Author.

          Publisher

          Association for Computing Machinery

          New York, NY, United States

          Publication History

          • Published: 27 May 2018

          Check for updates

          Qualifiers

          • abstract

          Acceptance Rates

          Overall Acceptance Rate276of1,856submissions,15%

          Upcoming Conference

          ICSE 2025

        PDF Format

        View or Download as a PDF file.

        PDF

        eReader

        View online with eReader.

        eReader