skip to main content
10.1145/1150343.1150369acmconferencesArticle/Chapter ViewAbstractPublication PagessbcciConference Proceedingsconference-collections
Article

A test chip for automatic MOSFET mismatch characterization

Published: 28 August 2006 Publication History

Abstract

This paper describes a test circuit for intensive characterization of MOS transistors mismatch. It aggregates analog switches, a shift register and a reference circuit, as well as the matrix of 1296 transistors to be tested. This circuit was integrated in a 0.35 mm bulk technology, and was designed to give experimental support for our MOSFET mismatch model. The test chip was characterized over a wide range of operation conditions, from weak to strong inversion, from linear to saturation region, allowing the analysis of MOSFET mismatch from bias, process and geometric parameters.

References

[1]
J-B Shyu, G. C. Temes, and F. Krummenacher, "Random error effects in matched MOS capacitors and current sources", IEEE J. Solid-State Circuits, vol. 19, no. 6, pp. 948--955, Dec. 1984.
[2]
M. J. M. Pelgrom, A. C. J. Duinmaijer, and A. P. G. Welbers, "Matching properties of MOS transistors", IEEE J. Solid-State Circuits, vol. 24, no. 5, pp. 1433--1440, Oct. 1989.
[3]
J. Pineda-Gyvez and H. P. Tuinhout "Threshold voltage mismatch and intra-die leakage current in digital CMOS circuits", IEEE J. Solid-State Circuits, vol. 39, no. 1, pp. 157--168, Jan. 2004.
[4]
H. Klimach, C. Galup-Montoro, M.C. Schneider, and A. Arnaud, "MOSFET Mismatch Modeling: A New Approach", IEEE Design&Test of Computers, vol. 23, no. 1, pp 20--29, Jan. 2006.
[5]
H. Klimach, A. Arnaud, M.C. Schneider, and C. Galup-Montoro, "Characterization of MOS transistor current mismatch", Proc. 17th Symposium on Integrated Circuits and Systems Design, SBCCI 2004, pp. 33--38, 2004.
[6]
C. Galup-Montoro, M.C. Schneider, H. Klimach, and A. Arnaud, "A compact model of MOSFET mismatch for circuit design", IEEE J. Solid-State Circuits, vol. 40, no. 8, pp. 1649--1657, Aug. 2005.
[7]
A. Pergoot, B. Graindourze, E. Janssens et al. "Statistics for matching", Proc. 1995 International Conference on Microelectronic Test Structures, pp. 193--197, March 1995.
[8]
M. Quarantelli et al., "Characterization and modeling of MOSFET mismatch of a deep submicron technology", Proc. IEEE 2003 Int. Conference on Microelectronic Test Structures, pp. 238--243, 2003.
[9]
H. P. Tuinhout, "Design of matching test structures", Proc. IEEE 1994 Int. Conference on Microelectronic Test Structures, pp. 21--27, 1994.
[10]
M-F. Lan and R. Geiger, "Impact of model errors on predicting performance of matching-critical circuits, Proc. 43rd. IEEE Midwest Symp. on Circuits and Systems, pp.1324--1328, 2000.
[11]
H. Yang et al. "Current mismatch due to local dopant fluctuations in MOSFET channel", IEEE Trans. Electron Devices, vol. 50, no. 11, pp. 2248--2254, Nov. 2003.
[12]
F. Forti and M. E. Wright, "Measurements of MOS current mismatch in the weak inversion region", IEEE J. Solid-State Circuits, vol. 29, no. 2, pp. 138--142, Feb. 1994.
[13]
A. I. A. Cunha, M. C. Schneider, C. Galup-Montoro, "An MOS transistor model for analog circuit design", IEEE J. Solid-State Circuits, vol.33, no.10, pp. 1510--1519, Oct.1998.
[14]
T. Mizuno, "Influence of statistical spacial-nonunifirmity of dopant atoms on threshold voltage in a system of many MOSFETs", Jpn. J. Appl. Phys., vol. 35, pp. 842--848, 1996.
[15]
S. J. Lovett et al., "Sensitivity of MOS transistor mismatch to device dimensions and suggestions on how to improve matching performance", Proc. IEEE 1995 Colloquium on Improving the Efficiency of IC Manufacturing Technology, pp. 11/1--11/5, 1995.

Cited By

View all
  • (2008)An M-2M digital-to-analog converter design methodology based on a physical mismatch model2008 IEEE International Symposium on Circuits and Systems10.1109/ISCAS.2008.4541902(2254-2257)Online publication date: May-2008

Index Terms

  1. A test chip for automatic MOSFET mismatch characterization

    Recommendations

    Comments

    Information & Contributors

    Information

    Published In

    cover image ACM Conferences
    SBCCI '06: Proceedings of the 19th annual symposium on Integrated circuits and systems design
    August 2006
    248 pages
    ISBN:1595934790
    DOI:10.1145/1150343
    Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

    Sponsors

    Publisher

    Association for Computing Machinery

    New York, NY, United States

    Publication History

    Published: 28 August 2006

    Permissions

    Request permissions for this article.

    Check for updates

    Author Tags

    1. MOSFET
    2. analog design
    3. characterization
    4. matching
    5. mismatch

    Qualifiers

    • Article

    Conference

    SBCCI06
    Sponsor:
    SBCCI06: 19th Symposium on Integrated Circuits and System Design
    August 28 - September 1, 2006
    MG, Ouro Preto, Brazil

    Acceptance Rates

    Overall Acceptance Rate 133 of 347 submissions, 38%

    Contributors

    Other Metrics

    Bibliometrics & Citations

    Bibliometrics

    Article Metrics

    • Downloads (Last 12 months)7
    • Downloads (Last 6 weeks)1
    Reflects downloads up to 16 Feb 2025

    Other Metrics

    Citations

    Cited By

    View all
    • (2008)An M-2M digital-to-analog converter design methodology based on a physical mismatch model2008 IEEE International Symposium on Circuits and Systems10.1109/ISCAS.2008.4541902(2254-2257)Online publication date: May-2008

    View Options

    Login options

    View options

    PDF

    View or Download as a PDF file.

    PDF

    eReader

    View online with eReader.

    eReader

    Figures

    Tables

    Media

    Share

    Share

    Share this Publication link

    Share on social media